BibTeX record conf/dft/GaoWZLG0R20

• > Home > conf/dft/GaoWZLG0R20

@inproceedings{DBLP:conf/dft/GaoWZLG0R20,
  author       = {Zhen Gao and
                  Xiaohui Wei and
                  Han Zhang and
                  Wenshuo Li and
                  Guangjun Ge and
                  Yu Wang and
                  Pedro Reviriego},
  editor       = {Luigi Dilillo and
                  Mihalis Psarakis and
                  Taniya Siddiqua},
  title        = {Reliability Evaluation of Pruned Neural Networks against Errors on
                  Parameters},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2020, Frascati, Italy, October 19-21,
                  2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/DFT50435.2020.9250812},
  doi          = {10.1109/DFT50435.2020.9250812},
  timestamp    = {Mon, 31 Oct 2022 15:25:40 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/GaoWZLG0R20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}