BibTeX record conf/dft/GaitondeWM95

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@inproceedings{DBLP:conf/dft/GaitondeWM95,
  author       = {Dinesh D. Gaitonde and
                  D. M. H. Walker and
                  Wojciech Maly},
  title        = {Accurate yield estimation of circuits with redundancy},
  booktitle    = {1995 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 1995, Lafayette, LA, USA,
                  November 13-15, 1995},
  pages        = {155--163},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/DFTVS.1995.476948},
  doi          = {10.1109/DFTVS.1995.476948},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/GaitondeWM95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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