BibTeX record conf/dft/FarayolaBCSRC22

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@inproceedings{DBLP:conf/dft/FarayolaBCSRC22,
  author       = {Praise O. Farayola and
                  Isaac Bruce and
                  Shravan K. Chaganti and
                  Abalhassan Sheikh and
                  Srivaths Ravi and
                  Degang Chen},
  editor       = {Luca Cassano and
                  Sreejit Chakravarty and
                  Alberto Bosio},
  title        = {Cross-Correlation Approach to Detecting Issue Test Sites in Massive
                  Parallel Testing},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2022, Austin, TX, USA, October 19-21,
                  2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/DFT56152.2022.9962367},
  doi          = {10.1109/DFT56152.2022.9962367},
  timestamp    = {Mon, 26 Jun 2023 20:47:42 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/FarayolaBCSRC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}