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BibTeX record conf/dft/FangH06
@inproceedings{DBLP:conf/dft/FangH06, author = {Lei Fang and Michael S. Hsiao}, title = {Bilateral Testing of Nano-scale Fault-tolerant Circuits}, booktitle = {21th {IEEE} International Symposium on Defect and Fault-Tolerance in {VLSI} Systems {(DFT} 2006), 4-6 October 2006, Arlington, Virginia, {USA}}, pages = {309--317}, publisher = {{IEEE} Computer Society}, year = {2006}, url = {https://doi.org/10.1109/DFT.2006.17}, doi = {10.1109/DFT.2006.17}, timestamp = {Fri, 24 Mar 2023 00:02:09 +0100}, biburl = {https://dblp.org/rec/conf/dft/FangH06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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