BibTeX record conf/dft/CrepeauTS93

download as .bib file

@inproceedings{DBLP:conf/dft/CrepeauTS93,
  author       = {J. Cr{\'{e}}peau and
                  Claude Thibeault and
                  Yvon Savaria},
  editor       = {Fabrizio Lombardi and
                  Mariagiovanna Sami and
                  Yvon Savaria and
                  Renato Stefanelli},
  title        = {Some Results on Yield and Local Design Rule Relaxation},
  booktitle    = {The {IEEE} International Workshop on Defect and Fault Tolerance in
                  {VLSI} Systems, October 27-29, 1993, Venice, Italy, Proceedings},
  pages        = {144--151},
  publisher    = {{IEEE} Computer Society},
  year         = {1993},
  timestamp    = {Mon, 03 Feb 2003 15:42:56 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/CrepeauTS93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics