BibTeX record conf/dft/ChapmanTTMYKK15

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@inproceedings{DBLP:conf/dft/ChapmanTTMYKK15,
  author       = {Glenn H. Chapman and
                  Rahul Thomas and
                  Rohan Thomas and
                  Klinsmann J. Coelho Silva Meneses and
                  Tommy Q. Yang and
                  Israel Koren and
                  Zahava Koren},
  title        = {Single Event Upsets and Hot Pixels in digital imagers},
  booktitle    = {2015 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFTS} 2015, Amherst, MA, USA,
                  October 12-14, 2015},
  pages        = {41--46},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/DFT.2015.7315133},
  doi          = {10.1109/DFT.2015.7315133},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ChapmanTTMYKK15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}