BibTeX record conf/dft/ChapmanTMZKK20

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@inproceedings{DBLP:conf/dft/ChapmanTMZKK20,
  author       = {Glenn H. Chapman and
                  Rohan Thomas and
                  Klinsmann J. Coelho Silva Meneses and
                  Ruoyi Zhao and
                  Israel Koren and
                  Zahava Koren},
  editor       = {Luigi Dilillo and
                  Mihalis Psarakis and
                  Taniya Siddiqua},
  title        = {Using digital imagers to characterize the dependence of energy and
                  area distributions of SEUs on elevation},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2020, Frascati, Italy, October 19-21,
                  2020},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/DFT50435.2020.9250888},
  doi          = {10.1109/DFT50435.2020.9250888},
  timestamp    = {Tue, 17 Nov 2020 14:06:59 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ChapmanTMZKK20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}