BibTeX record conf/dft/ChapmanTKK12

download as .bib file

@inproceedings{DBLP:conf/dft/ChapmanTKK12,
  author       = {Glenn H. Chapman and
                  Rohit Thomas and
                  Israel Koren and
                  Zahava Koren},
  title        = {Relating digital imager defect rates to pixel size, sensor area and
                  {ISO}},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {164--169},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378218},
  doi          = {10.1109/DFT.2012.6378218},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ChapmanTKK12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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