BibTeX record conf/dft/ChapmanPLKK17

• > Home > conf/dft/ChapmanPLKK17

@inproceedings{DBLP:conf/dft/ChapmanPLKK17,
  author       = {Glenn H. Chapman and
                  Parham Purbakht and
                  Peter Le and
                  Israel Koren and
                  Zahava Koren},
  title        = {Exploring soft errors (SEUs) with digital imager pixels ranging from
                  7 to 1.3 {\(\mu\)}m},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244457},
  doi          = {10.1109/DFT.2017.8244457},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ChapmanPLKK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}