BibTeX record: conf/dft/ChapmanLNKK11

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@inproceedings{DBLP:conf/dft/ChapmanLNKK11,
  author    = {Glenn H. Chapman and
               Jenny Leung and
               Ana Namburete and
               Israel Koren and
               Zahava Koren},
  title     = {Predicting Pixel Defect Rates Based on Image Sensor Parameters.},
  booktitle = {2011 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 2011, Vancouver, BC, Canada,
               October 3-5, 2011},
  year      = {2011},
  pages     = {408--416},
  crossref  = {DBLP:conf/dft/2011},
  url       = {http://doi.ieeecomputersociety.org/10.1109/DFT.2011.58},
  doi       = {10.1109/DFT.2011.58},
  timestamp = {Wed, 03 Sep 2014 00:03:12 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/dft/ChapmanLNKK11},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/dft/2011,
  title     = {2011 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 2011, Vancouver, BC, Canada,
               October 3-5, 2011},
  year      = {2011},
  publisher = {{IEEE}},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6104273},
  isbn      = {978-1-4577-1713-0},
  timestamp = {Wed, 03 Sep 2014 00:03:12 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/dft/2011},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}