@inproceedings{DBLP:conf/dft/ChapmanJB04,
author = {Glenn H. Chapman and
Vijay K. Jain and
Shekhar Bhansali},
title = {Defect Avoidance in a 3-D Heterogeneous Sensor},
booktitle = {DFT},
year = {2004},
pages = {67-75},
ee = {http://doi.ieeecomputersociety.org/10.1109/DFT.2004.23},
crossref = {DBLP:conf/dft/2004},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dft/2004,
title = {19th IEEE International Symposium on Defect and Fault-Tolerance
in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes,
France, Proceedings},
booktitle = {DFT},
publisher = {IEEE Computer Society},
year = {2004},
isbn = {0-7695-2241-6},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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