BibTeX record conf/dft/ChangCPL02

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@inproceedings{DBLP:conf/dft/ChangCPL02,
  author       = {Y. Chang and
                  Minsu Choi and
                  Nohpill Park and
                  Fabrizio Lombardi},
  title        = {Repairability Evaluation of Embedded Multiple Region DRAMs},
  booktitle    = {17th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2002), 6-8 November 2002, Vancouver, BC,
                  Canada, Proceedings},
  pages        = {428--436},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/DFTVS.2002.1173541},
  doi          = {10.1109/DFTVS.2002.1173541},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ChangCPL02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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