Analysis of Defect to Yield Correlation on Memories: Method, Algorithms and Limits.

Pascal Bichebois Pierre Mathery Analysis of Defect to Yield Correlation on Memories: Method, Algorithms and Limits. 44-52 1997 conf/dft/1997 DFT http://computer.org/proceedings/dft/8168/81680044abs.htm db/conf/dft/dft1997.html#BicheboisM97