Test Compaction by Using Linear-Matrix Driven Scan Chains.

Sandeep Bhatia Test Compaction by Using Linear-Matrix Driven Scan Chains. 185-190 2003 conf/dft/2003 DFT http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250111 db/conf/dft/dft2003.html#Bhatia03