BibTeX
@inproceedings{DBLP:conf/dft/BeiuIAS06,
author = {Valeriu Beiu and
Walid Ibrahim and
Y. A. Alkhawwar and
Mawahib H. Sulieman},
title = {Gate Failures Effectively Shape Multiplexing},
booktitle = {DFT},
year = {2006},
pages = {29-40},
ee = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.33},
crossref = {DBLP:conf/dft/2006},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dft/2006,
title = {21th IEEE International Symposium on Defect and Fault-Tolerance
in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington,
Virginia, USA},
booktitle = {DFT},
publisher = {IEEE Computer Society},
year = {2006},
isbn = {0-7695-2706-X},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2009-06-09 by Michael Ley (ley@uni-trier.de)