BibTeX record conf/dft/BarbirottaMMVBC20

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@inproceedings{DBLP:conf/dft/BarbirottaMMVBC20,
  author       = {Marcello Barbirotta and
                  Antonio Mastrandrea and
                  Francesco Menichelli and
                  Francesco Vigli and
                  Luigi Blasi and
                  Abdallah Cheikh and
                  Stefano Sordillo and
                  Fabio Di Gennaro and
                  Mauro Olivieri},
  editor       = {Luigi Dilillo and
                  Mihalis Psarakis and
                  Taniya Siddiqua},
  title        = {Fault resilience analysis of a {RISC-V} microprocessor design through
                  a dedicated {UVM} environment},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2020, Frascati, Italy, October 19-21,
                  2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/DFT50435.2020.9250871},
  doi          = {10.1109/DFT50435.2020.9250871},
  timestamp    = {Sun, 04 Aug 2024 19:42:52 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/BarbirottaMMVBC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}