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BibTeX record conf/dft/BarbirottaMMVBC20
@inproceedings{DBLP:conf/dft/BarbirottaMMVBC20, author = {Marcello Barbirotta and Antonio Mastrandrea and Francesco Menichelli and Francesco Vigli and Luigi Blasi and Abdallah Cheikh and Stefano Sordillo and Fabio Di Gennaro and Mauro Olivieri}, editor = {Luigi Dilillo and Mihalis Psarakis and Taniya Siddiqua}, title = {Fault resilience analysis of a {RISC-V} microprocessor design through a dedicated {UVM} environment}, booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2020, Frascati, Italy, October 19-21, 2020}, pages = {1--6}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/DFT50435.2020.9250871}, doi = {10.1109/DFT50435.2020.9250871}, timestamp = {Sun, 04 Aug 2024 19:42:52 +0200}, biburl = {https://dblp.org/rec/conf/dft/BarbirottaMMVBC20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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