BibTeX
@inproceedings{DBLP:conf/dft/BanerjeeAR08,
author = {Nilanjan Banerjee and
Charles Augustine and
Kaushik Roy},
title = {Fault-Tolerance with Graceful Degradation in Quality: A
Design Methodology and Its Application to Digital Signal
Processing Systems},
booktitle = {DFT},
year = {2008},
pages = {323-331},
ee = {http://dx.doi.org/10.1109/DFT.2008.43},
crossref = {DBLP:conf/dft/2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dft/2008,
editor = {Cristiana Bolchini and
Yong-Bin Kim and
Dimitris Gizopoulos and
Mohammad Tehranipoor},
title = {23rd IEEE International Symposium on Defect and Fault-Tolerance
in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA,
USA},
booktitle = {DFT},
publisher = {IEEE Computer Society},
year = {2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2009-02-27 by Michael Ley (ley@uni-trier.de)