BibTeX
@inproceedings{DBLP:conf/dft/AshenMPL97,
author = {D. G. Ashen and
Fred J. Meyer and
Nohpill Park and
Fabrizio Lombardi},
title = {Testing of programmable logic devices (PLD) with faulty
resources},
booktitle = {DFT},
year = {1997},
pages = {76-84},
ee = {http://computer.org/proceedings/dft/8168/81680076abs.htm},
crossref = {DBLP:conf/dft/1997},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dft/1997,
title = {1997 Workshop on Defect and Fault-Tolerance in VLSI Systems
(DFT '97), 20-22 October 1997, Paris, France},
booktitle = {DFT},
publisher = {IEEE Computer Society},
year = {1997},
isbn = {0-8186-8168-3},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2004-12-01 by Michael Ley (ley@uni-trier.de)