AsaoITNYAIK08'

@inproceedings{DBLP:conf/dft/AsaoITNYAIK08,
  author    = {Yoshiaki Asao and
               Masayoshi Iwayama and
               Kenji Tsuchida and
               Akihiro Nitayama and
               Hiroaki Yoda and
               Hisanori Aikawa and
               Sumio Ikegawa and
               Tatsuya Kishi},
  title     = {A Statistical Model for Assessing the Fault Tolerance of
               Variable Switching Currents for a 1Gb Spin Transfer Torque
               Magnetoresistive Random Access Memory},
  booktitle = {DFT},
  year      = {2008},
  pages     = {507-515},
  ee        = {http://dx.doi.org/10.1109/DFT.2008.18},
  crossref  = {DBLP:conf/dft/2008},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/dft/2008,
  editor    = {Cristiana Bolchini and
               Yong-Bin Kim and
               Dimitris Gizopoulos and
               Mohammad Tehranipoor},
  title     = {23rd IEEE International Symposium on Defect and Fault-Tolerance
               in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA,
               USA},
  booktitle = {DFT},
  publisher = {IEEE Computer Society},
  year      = {2008},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}