BibTeX record conf/dft/AsaoITNYAIK08

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@inproceedings{DBLP:conf/dft/AsaoITNYAIK08,
  author       = {Yoshiaki Asao and
                  Masayoshi Iwayama and
                  Kenji Tsuchida and
                  Akihiro Nitayama and
                  Hiroaki Yoda and
                  Hisanori Aikawa and
                  Sumio Ikegawa and
                  Tatsuya Kishi},
  editor       = {Cristiana Bolchini and
                  Yong{-}Bin Kim and
                  Dimitris Gizopoulos and
                  Mohammad Tehranipoor},
  title        = {A Statistical Model for Assessing the Fault Tolerance of Variable
                  Switching Currents for a 1Gb Spin Transfer Torque Magnetoresistive
                  Random Access Memory},
  booktitle    = {23rd {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2008), 1-3 October 2008, Boston, MA, {USA}},
  pages        = {507--515},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/DFT.2008.18},
  doi          = {10.1109/DFT.2008.18},
  timestamp    = {Fri, 24 Mar 2023 00:02:10 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/AsaoITNYAIK08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}