BibTeX
@inproceedings{DBLP:conf/dft/AllanW97,
author = {Gerard A. Allan and
Anthony J. Walton},
title = {Efficient critical area estimation for arbitrary defect
shapes},
booktitle = {DFT},
year = {1997},
pages = {20-28},
ee = {http://computer.org/proceedings/dft/8168/81680020abs.htm},
crossref = {DBLP:conf/dft/1997},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dft/1997,
title = {1997 Workshop on Defect and Fault-Tolerance in VLSI Systems
(DFT '97), 20-22 October 1997, Paris, France},
booktitle = {DFT},
publisher = {IEEE Computer Society},
year = {1997},
isbn = {0-8186-8168-3},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2003-02-12 by Michael Ley (ley@uni-trier.de)