BibTeX record conf/dft/AllanW97

download as .bib file

@inproceedings{DBLP:conf/dft/AllanW97,
  author       = {Gerard A. Allan and
                  Anthony J. Walton},
  title        = {Efficient critical area estimation for arbitrary defect shapes},
  booktitle    = {1997 Workshop on Defect and Fault-Tolerance in {VLSI} Systems {(DFT}
                  '97), 20-22 October 1997, Paris, France},
  pages        = {20--28},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.org/10.1109/DFTVS.1997.628305},
  doi          = {10.1109/DFTVS.1997.628305},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/AllanW97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.