BibTeX record: conf/dft/Al-YamaniMM02

download as .bib file

@inproceedings{DBLP:conf/dft/Al-YamaniMM02,
  author    = {Ahmad A. Al{-}Yamani and
               Subhasish Mitra and
               Edward J. McCluskey},
  title     = {Testing Digital Circuits with Constraints},
  booktitle = {17th {IEEE} International Symposium on Defect and Fault-Tolerance
               in {VLSI} Systems {(DFT} 2002), 6-8 November 2002, Vancouver, BC,
               Canada, Proceedings},
  pages     = {195--206},
  year      = {2002},
  crossref  = {DBLP:conf/dft/2002},
  url       = {http://dx.doi.org/10.1109/DFTVS.2002.1173516},
  doi       = {10.1109/DFTVS.2002.1173516},
  timestamp = {Mon, 10 Nov 2014 18:11:37 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/dft/Al-YamaniMM02},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/dft/2002,
  title     = {17th {IEEE} International Symposium on Defect and Fault-Tolerance
               in {VLSI} Systems {(DFT} 2002), 6-8 November 2002, Vancouver, BC,
               Canada, Proceedings},
  publisher = {{IEEE} Computer Society},
  year      = {2002},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8374},
  isbn      = {0-7695-1831-1},
  timestamp = {Mon, 10 Nov 2014 18:11:36 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/dft/2002},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}