DBLP BibTeX Record 'conf/dft/Al-YamaniMM02'

@inproceedings{DBLP:conf/dft/Al-YamaniMM02,
  author    = {Ahmad A. Al-Yamani and
               Subhasish Mitra and
               Edward J. McCluskey},
  title     = {Testing Digital Circuits with Constraints},
  booktitle = {DFT},
  year      = {2002},
  pages     = {195-206},
  ee        = {http://www.computer.org/proceedings/dft/1831/18310195abs.htm},
  crossref  = {DBLP:conf/dft/2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dft/2002,
  title     = {17th IEEE International Symposium on Defect and Fault-Tolerance
               in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver,
               BC, Canada, Proceedings},
  booktitle = {DFT},
  publisher = {IEEE Computer Society},
  year      = {2002},
  isbn      = {0-7695-1831-1},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}