BibTeX record conf/dft/AarajNCK04

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@inproceedings{DBLP:conf/dft/AarajNCK04,
  author       = {Najwa Aaraj and
                  Anis Nazer and
                  Ali Chehab and
                  Ayman I. Kayssi},
  title        = {Transient Current Testing of Dynamic {CMOS} Circuits},
  booktitle    = {19th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2004), 10-13 October 2004, Cannes, France,
                  Proceedings},
  pages        = {264--271},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.ieeecomputersociety.org/10.1109/DFT.2004.62},
  doi          = {10.1109/DFT.2004.62},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/AarajNCK04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}