BibTeX record conf/dese/LooLS23

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@inproceedings{DBLP:conf/dese/LooLS23,
  author       = {Mee Chun Loo and
                  Rajasvaran Logeswaran and
                  Zailan Arabee bin Abdul Salam},
  title        = {{CNN} Aided Surface Inspection for {SMT} Manufacturing},
  booktitle    = {15th International Conference on Developments in eSystems Engineering,
                  DeSE 2023, Baghdad {\&} Anbar, Iraq, January 9-12, 2023},
  pages        = {328--332},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/DeSE58274.2023.10099694},
  doi          = {10.1109/DESE58274.2023.10099694},
  timestamp    = {Wed, 26 Apr 2023 16:58:07 +0200},
  biburl       = {https://dblp.org/rec/conf/dese/LooLS23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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