Jongsoo Yim Gunbae Kim Incheol Nam Sangki Son Jonghyoung Lim Hwacheol Lee Sangseok Kang Byungheon Kwak Jinseok Lee Sungho Kang A Prevenient Voltage Stress Test Method for High Density Memory. 516-520 2008 DELTA http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.93 conf/delta/2008 db/conf/delta/delta2008.html#YimKNSLLKKLK08