DBLP Record 'conf/delta/YimKNSLLKKLK08'

BibTeX

@inproceedings{DBLP:conf/delta/YimKNSLLKKLK08,
  author    = {Jongsoo Yim and
               Gunbae Kim and
               Incheol Nam and
               Sangki Son and
               Jonghyoung Lim and
               Hwacheol Lee and
               Sangseok Kang and
               Byungheon Kwak and
               Jinseok Lee and
               Sungho Kang},
  title     = {A Prevenient Voltage Stress Test Method for High Density
               Memory},
  booktitle = {DELTA},
  year      = {2008},
  pages     = {516-520},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.93},
  crossref  = {DBLP:conf/delta/2008},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/delta/2008,
  title     = {4th IEEE International Symposium on Electronic Design, Test
               and Applications, DELTA 2008, Hong Kong, January 23-25,
               2008},
  booktitle = {DELTA},
  publisher = {IEEE Computer Society},
  year      = {2008},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}