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BibTeX record conf/ddecs/YamazakiWHY13
@inproceedings{DBLP:conf/ddecs/YamazakiWHY13, author = {Hiroshi Yamazaki and Motohiro Wakazono and Toshinori Hosokawa and Masayoshi Yoshimura}, editor = {Luk{\'{a}}s Sekanina and G{\"{o}}rschwin Fey and Jaan Raik and Snorre Aunet and Richard Ruzicka}, title = {A don't care identification method for test compaction}, booktitle = {16th {IEEE} International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems, {DDECS} 2013, Karlovy Vary, Czech Republic, April 8-10, 2013}, pages = {215--218}, publisher = {{IEEE} Computer Society}, year = {2013}, url = {https://doi.org/10.1109/DDECS.2013.6549819}, doi = {10.1109/DDECS.2013.6549819}, timestamp = {Fri, 24 Mar 2023 00:04:14 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/YamazakiWHY13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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