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BibTeX record conf/ddecs/SaadatSafaMT23
@inproceedings{DBLP:conf/ddecs/SaadatSafaMT23, author = {Maryam Saadat{-}Safa and Tahoura Mosavirik and Shahin Tajik}, editor = {Maksim Jenihhin and Hana Kub{\'{a}}tov{\'{a}} and Nele Metens and Jaan Raik and Foisal Ahmed and Jan Belohoubek}, title = {Counterfeit Chip Detection using Scattering Parameter Analysis}, booktitle = {26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, {DDECS} 2023, Tallinn, Estonia, May 3-5, 2023}, pages = {99--104}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/DDECS57882.2023.10139623}, doi = {10.1109/DDECS57882.2023.10139623}, timestamp = {Mon, 26 Jun 2023 20:46:03 +0200}, biburl = {https://dblp.org/rec/conf/ddecs/SaadatSafaMT23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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