BibTeX record conf/ddecs/SaadatSafaMT23

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@inproceedings{DBLP:conf/ddecs/SaadatSafaMT23,
  author       = {Maryam Saadat{-}Safa and
                  Tahoura Mosavirik and
                  Shahin Tajik},
  editor       = {Maksim Jenihhin and
                  Hana Kub{\'{a}}tov{\'{a}} and
                  Nele Metens and
                  Jaan Raik and
                  Foisal Ahmed and
                  Jan Belohoubek},
  title        = {Counterfeit Chip Detection using Scattering Parameter Analysis},
  booktitle    = {26th International Symposium on Design and Diagnostics of Electronic
                  Circuits and Systems, {DDECS} 2023, Tallinn, Estonia, May 3-5, 2023},
  pages        = {99--104},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/DDECS57882.2023.10139623},
  doi          = {10.1109/DDECS57882.2023.10139623},
  timestamp    = {Mon, 26 Jun 2023 20:46:03 +0200},
  biburl       = {https://dblp.org/rec/conf/ddecs/SaadatSafaMT23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}