Diagnosis of Realistic Defects Based on the X-Fault Model.

Ilia Polian Kohei Miyase Yusuke Nakamura Seiji Kajihara Piet Engelke Bernd Becker Stefan Spinner Xiaoqing Wen Diagnosis of Realistic Defects Based on the X-Fault Model. 263-266 2008 DDECS http://dx.doi.org/10.1109/DDECS.2008.4538798 conf/ddecs/2008 db/conf/ddecs/ddecs2008.html#PolianMNKEBSW08