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BibTeX record conf/ddecs/NosratiN23
@inproceedings{DBLP:conf/ddecs/NosratiN23, author = {Nooshin Nosrati and Zainalabedin Navabi}, editor = {Maksim Jenihhin and Hana Kub{\'{a}}tov{\'{a}} and Nele Metens and Jaan Raik and Foisal Ahmed and Jan Belohoubek}, title = {A Low-cost Residue-based Scheme for Error-resiliency of {RNN} Accelerators}, booktitle = {26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, {DDECS} 2023, Tallinn, Estonia, May 3-5, 2023}, pages = {83--86}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/DDECS57882.2023.10139388}, doi = {10.1109/DDECS57882.2023.10139388}, timestamp = {Wed, 07 Jun 2023 22:08:03 +0200}, biburl = {https://dblp.org/rec/conf/ddecs/NosratiN23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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