BibTeX record conf/ddecs/NosratiN23

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@inproceedings{DBLP:conf/ddecs/NosratiN23,
  author       = {Nooshin Nosrati and
                  Zainalabedin Navabi},
  editor       = {Maksim Jenihhin and
                  Hana Kub{\'{a}}tov{\'{a}} and
                  Nele Metens and
                  Jaan Raik and
                  Foisal Ahmed and
                  Jan Belohoubek},
  title        = {A Low-cost Residue-based Scheme for Error-resiliency of {RNN} Accelerators},
  booktitle    = {26th International Symposium on Design and Diagnostics of Electronic
                  Circuits and Systems, {DDECS} 2023, Tallinn, Estonia, May 3-5, 2023},
  pages        = {83--86},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/DDECS57882.2023.10139388},
  doi          = {10.1109/DDECS57882.2023.10139388},
  timestamp    = {Wed, 07 Jun 2023 22:08:03 +0200},
  biburl       = {https://dblp.org/rec/conf/ddecs/NosratiN23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}