Memories in Scaled Technologies: A Review of Process Induced Failures, Test Methodologies, and Fault Tolerance.

Saibal Mukhopadhyay Qikai Chen Kaushik Roy Memories in Scaled Technologies: A Review of Process Induced Failures, Test Methodologies, and Fault Tolerance. 69-74 2007 conf/ddecs/2007 DDECS db/conf/ddecs/ddecs2007.html#MukhopadhyayCR07