BibTeX record conf/ddecs/LeeWH11

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@inproceedings{DBLP:conf/ddecs/LeeWH11,
  author       = {Dae Young Lee and
                  David D. Wentzloff and
                  John P. Hayes},
  editor       = {Rolf Kraemer and
                  Adam Pawlak and
                  Andreas Steininger and
                  Mario Sch{\"{o}}lzel and
                  Jaan Raik and
                  Heinrich Theodor Vierhaus},
  title        = {Wireless wafer-level testing of integrated circuits via capacitively-coupled
                  channels},
  booktitle    = {14th {IEEE} International Symposium on Design and Diagnostics of Electronic
                  Circuits {\&} Systems, {DDECS} 2011, Cottbus, Germany, April 13-15,
                  2011},
  pages        = {99--104},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/DDECS.2011.5783056},
  doi          = {10.1109/DDECS.2011.5783056},
  timestamp    = {Sat, 30 Sep 2023 09:38:47 +0200},
  biburl       = {https://dblp.org/rec/conf/ddecs/LeeWH11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}