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BibTeX record conf/ddecs/GyepesBAS11
@inproceedings{DBLP:conf/ddecs/GyepesBAS11, author = {G{\'{a}}bor Gyepes and Juraj Brenkus and Daniel Arbet and Viera Stopjakov{\'{a}}}, editor = {Rolf Kraemer and Adam Pawlak and Andreas Steininger and Mario Sch{\"{o}}lzel and Jaan Raik and Heinrich Theodor Vierhaus}, title = {Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies}, booktitle = {14th {IEEE} International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems, {DDECS} 2011, Cottbus, Germany, April 13-15, 2011}, pages = {395--396}, publisher = {{IEEE} Computer Society}, year = {2011}, url = {https://doi.org/10.1109/DDECS.2011.5783118}, doi = {10.1109/DDECS.2011.5783118}, timestamp = {Fri, 24 Mar 2023 00:04:14 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/GyepesBAS11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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