BibTeX record conf/ddecs/FibichHO23

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@inproceedings{DBLP:conf/ddecs/FibichHO23,
  author       = {Christian Fibich and
                  Martin Horauer and
                  Roman Obermaisser},
  editor       = {Maksim Jenihhin and
                  Hana Kub{\'{a}}tov{\'{a}} and
                  Nele Metens and
                  Jaan Raik and
                  Foisal Ahmed and
                  Jan Belohoubek},
  title        = {Characterization of Interconnect Fault Effects in SRAM-based FPGAs},
  booktitle    = {26th International Symposium on Design and Diagnostics of Electronic
                  Circuits and Systems, {DDECS} 2023, Tallinn, Estonia, May 3-5, 2023},
  pages        = {65--68},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/DDECS57882.2023.10139343},
  doi          = {10.1109/DDECS57882.2023.10139343},
  timestamp    = {Wed, 07 Jun 2023 22:08:03 +0200},
  biburl       = {https://dblp.org/rec/conf/ddecs/FibichHO23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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