DubeyGB07'

BibTeX

@inproceedings{DBLP:conf/ddecs/DubeyGB07,
  author    = {Prashant Dubey and
               Akhil Garg and
               Sravan Kumar Bhaskarani},
  title     = {Built in Defect Prognosis for Embedded Memories},
  booktitle = {DDECS},
  year      = {2007},
  pages     = {167-172},
  crossref  = {DBLP:conf/ddecs/2007},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ddecs/2007,
  editor    = {Patrick Girard and
               Andrzej Krasniewski and
               Elena Gramatov{\'a} and
               Adam Pawlak and
               Tomasz Garbolino},
  title     = {Proceedings of the 10th IEEE Workshop on Design {\&} Diagnostics
               of Electronic Circuits {\&} Systems (DDECS 2007), Krak{\'o}w,
               Poland, April 11-13, 2007},
  booktitle = {DDECS},
  publisher = {IEEE Computer Society},
  year      = {2007},
  isbn      = {1-4244-1161-0},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}