An efficient fault simulation technique for transition faults in non-scan sequential circuits.

Alberto Bosio Patrick Girard Serge Pravossoudovitch Paolo Bernardi Matteo Sonza Reorda An efficient fault simulation technique for transition faults in non-scan sequential circuits. 50-55 2009 DDECS http://dx.doi.org/10.1109/DDECS.2009.5012098 conf/ddecs/2009 db/conf/ddecs/ddecs2009.html#BosioGPBR09