A sparse grid based spectral stochastic collocation method for variations-aware capacitance extraction of interconnects under nanometer process technology.

Hengliang Zhu Xuan Zeng Wei Cai Jintao Xue Dian Zhou A sparse grid based spectral stochastic collocation method for variations-aware capacitance extraction of interconnects under nanometer process technology. 1514-1519 2007 conf/date/2007 DATE http://doi.acm.org/10.1145/1266366.1266698 db/conf/date/date2007.html#ZhuZCXZ07