Huaxing Tang Gang Chen 0011 Sudhakar M. Reddy Chen Wang Janusz Rajski Irith Pomeranz Defect Aware Test Patterns. 450-455 2005 conf/date/2005 DATE http://doi.ieeecomputersociety.org/10.1109/DATE.2005.110 db/conf/date/date2005.html#TangCRWRP05