@inproceedings{DBLP:conf/date/ShinKK99,
author = {Jongchul Shin and
Hyunjin Kim and
Sungho Kang},
title = {At-Speed Boundary-Scan Interconnect Testing in a Board with
Multiple System Clocks},
booktitle = {DATE},
year = {1999},
pages = {473-},
ee = {http://doi.ieeecomputersociety.org/10.1109/DATE.1999.761168},
crossref = {DBLP:conf/date/1999},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/date/1999,
title = {1999 Design, Automation and Test in Europe (DATE '99), 9-12
March 1999, Munich, Germany},
booktitle = {DATE},
publisher = {IEEE Computer Society},
year = {1999},
isbn = {0-7695-0078-1},
bibsource = {DBLP, http://dblp.uni-trier.de}
}