BibTeX
@inproceedings{DBLP:conf/date/PronathGA02,
author = {Michael Pronath and
Helmut E. Graeb and
Kurt Antreich},
title = {A Test Design Method for Floating Gate Defects (FGD) in
Analog Integrated Circuits},
booktitle = {DATE},
year = {2002},
pages = {78-83},
ee = {http://csdl.computer.org/comp/proceedings/date/2002/1471/00/14710078abs.htm},
crossref = {DBLP:conf/date/2002},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/date/2002,
title = {2002 Design, Automation and Test in Europe Conference and
Exposition (DATE 2002), 4-8 March 2002, Paris, France},
booktitle = {DATE},
publisher = {IEEE Computer Society},
year = {2002},
isbn = {0-7695-1471-5},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2003-09-01 by Michael Ley (ley@uni-trier.de)