A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects.

Sungju Park Taehyung Kim A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects. 458- 2000 conf/date/2000 DATE http://csdl.computer.org/comp/proceedings/date/2000/0537/00/05370458abs.htm db/conf/date/date2000.html#ParkK00