NeyGLPVB07'

BibTeX

@inproceedings{DBLP:conf/date/NeyGLPVB07,
  author    = {Alexandre Ney and
               Patrick Girard and
               Christian Landrault and
               Serge Pravossoudovitch and
               Arnaud Virazel and
               Magali Bastian},
  title     = {Slow write driver faults in 65nm SRAM technology: analysis
               and March test solution},
  booktitle = {DATE},
  year      = {2007},
  pages     = {528-533},
  ee        = {http://doi.acm.org/10.1145/1266366.1266479},
  crossref  = {DBLP:conf/date/2007},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/date/2007,
  editor    = {Rudy Lauwereins and
               Jan Madsen},
  title     = {2007 Design, Automation and Test in Europe Conference and
               Exposition (DATE 2007), April 16-20, 2007, Nice, France},
  booktitle = {DATE},
  publisher = {ACM},
  year      = {2007},
  isbn      = {978-3-9810801-2-4},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}