DBLP Record 'conf/date/NelsonZDBPMB06'

BibTeX

@inproceedings{DBLP:conf/date/NelsonZDBPMB06,
  author    = {Jeffrey E. Nelson and
               Thomas Zanon and
               Rao Desineni and
               Jason G. Brown and
               N. Patil and
               Wojciech Maly and
               R. D. (Shawn) Blanton},
  title     = {Extraction of defect density and size distributions from
               wafer sort test results},
  booktitle = {DATE},
  year      = {2006},
  pages     = {913-918},
  ee        = {http://doi.acm.org/10.1145/1131737},
  crossref  = {DBLP:conf/date/2006p},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/date/2006p,
  editor    = {Georges G. E. Gielen},
  title     = {Proceedings of the Conference on Design, Automation and
               Test in Europe, DATE 2006, Munich, Germany,  March 6-10,
               2006},
  booktitle = {DATE},
  publisher = {European Design and Automation Association, Leuven, Belgium},
  year      = {2006},
  isbn      = {3-9810801-0-6},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}