BibTeX record conf/date/NabhanDRDS23

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@inproceedings{DBLP:conf/date/NabhanDRDS23,
  author       = {Roukoz Nabhan and
                  Jean{-}Max Dutertre and
                  Jean{-}Baptiste Rigaud and
                  Jean{-}Luc Danger and
                  Laurent Sauvage},
  title        = {Highlighting Two {EM} Fault Models While Analyzing a Digital Sensor
                  Limitations},
  booktitle    = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
                  {DATE} 2023, Antwerp, Belgium, April 17-19, 2023},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.23919/DATE56975.2023.10137124},
  doi          = {10.23919/DATE56975.2023.10137124},
  timestamp    = {Tue, 07 May 2024 20:04:25 +0200},
  biburl       = {https://dblp.org/rec/conf/date/NabhanDRDS23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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