BibTeX record conf/date/MurgaiRMHT04

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@inproceedings{DBLP:conf/date/MurgaiRMHT04,
  author       = {Rajeev Murgai and
                  Subodh M. Reddy and
                  Takashi Miyoshi and
                  Takeshi Horie and
                  Mehdi Baradaran Tahoori},
  title        = {Sensitivity-Based Modeling and Methodology for Full-Chip Substrate
                  Noise Analysis},
  booktitle    = {2004 Design, Automation and Test in Europe Conference and Exposition
                  {(DATE} 2004), 16-20 February 2004, Paris, France},
  pages        = {610--615},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/DATE.2004.1268912},
  doi          = {10.1109/DATE.2004.1268912},
  timestamp    = {Fri, 24 Mar 2023 00:02:45 +0100},
  biburl       = {https://dblp.org/rec/conf/date/MurgaiRMHT04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}