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BibTeX record conf/date/LippmannBLMBHGK22
@inproceedings{DBLP:conf/date/LippmannBLMBHGK22, author = {Bernhard Lippmann and Ann{-}Christin Bette and Matthias Ludwig and Johannes Mutter and Johanna Baehr and Alexander Hepp and Horst A. Gieser and Nicola Kovac and Tobias Zweifel and Martin Rasche and Oliver Kellermann}, editor = {Cristiana Bolchini and Ingrid Verbauwhede and Ioana Vatajelu}, title = {Physical and Functional Reverse Engineering Challenges for Advanced Semiconductor Solutions}, booktitle = {2022 Design, Automation {\&} Test in Europe Conference {\&} Exhibition, {DATE} 2022, Antwerp, Belgium, March 14-23, 2022}, pages = {796--801}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.23919/DATE54114.2022.9774610}, doi = {10.23919/DATE54114.2022.9774610}, timestamp = {Sat, 30 Sep 2023 09:38:41 +0200}, biburl = {https://dblp.org/rec/conf/date/LippmannBLMBHGK22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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