BibTeX record conf/date/LippmannBLMBHGK22

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@inproceedings{DBLP:conf/date/LippmannBLMBHGK22,
  author       = {Bernhard Lippmann and
                  Ann{-}Christin Bette and
                  Matthias Ludwig and
                  Johannes Mutter and
                  Johanna Baehr and
                  Alexander Hepp and
                  Horst A. Gieser and
                  Nicola Kovac and
                  Tobias Zweifel and
                  Martin Rasche and
                  Oliver Kellermann},
  editor       = {Cristiana Bolchini and
                  Ingrid Verbauwhede and
                  Ioana Vatajelu},
  title        = {Physical and Functional Reverse Engineering Challenges for Advanced
                  Semiconductor Solutions},
  booktitle    = {2022 Design, Automation {\&} Test in Europe Conference {\&}
                  Exhibition, {DATE} 2022, Antwerp, Belgium, March 14-23, 2022},
  pages        = {796--801},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.23919/DATE54114.2022.9774610},
  doi          = {10.23919/DATE54114.2022.9774610},
  timestamp    = {Sat, 30 Sep 2023 09:38:41 +0200},
  biburl       = {https://dblp.org/rec/conf/date/LippmannBLMBHGK22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}