BibTeX record conf/date/LinSHNTH19

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@inproceedings{DBLP:conf/date/LinSHNTH19,
  author       = {Ting{-}You Lin and
                  Chauchin Su and
                  Chung{-}Chih Hung and
                  Karuna Nidhi and
                  Chily Tu and
                  Shao{-}Chang Huang},
  editor       = {J{\"{u}}rgen Teich and
                  Franco Fummi},
  title        = {Package and Chip Accelerated Aging Methods for Power {MOSFET} Reliability
                  Evaluation},
  booktitle    = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
                  {DATE} 2019, Florence, Italy, March 25-29, 2019},
  pages        = {1661--1666},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.23919/DATE.2019.8714895},
  doi          = {10.23919/DATE.2019.8714895},
  timestamp    = {Mon, 30 Sep 2024 15:20:52 +0200},
  biburl       = {https://dblp.org/rec/conf/date/LinSHNTH19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}