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BibTeX record conf/date/LiHCSWCCHL02
@inproceedings{DBLP:conf/date/LiHCSWCCHL02, author = {Jin{-}Fu Li and Hsin{-}Jung Huang and Jeng{-}Bin Chen and Chih{-}Pin Su and Cheng{-}Wen Wu and Chuang Cheng and Shao{-}I Chen and Chi{-}Yi Hwang and Hsiao{-}Ping Lin}, title = {A Hierarchical Test Scheme for System-On-Chip Designs}, booktitle = {2002 Design, Automation and Test in Europe Conference and Exposition {(DATE} 2002), 4-8 March 2002, Paris, France}, pages = {486--490}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/DATE.2002.998317}, doi = {10.1109/DATE.2002.998317}, timestamp = {Tue, 17 Oct 2023 15:22:33 +0200}, biburl = {https://dblp.org/rec/conf/date/LiHCSWCCHL02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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