BibTeX record conf/date/LiHCSWCCHL02

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@inproceedings{DBLP:conf/date/LiHCSWCCHL02,
  author       = {Jin{-}Fu Li and
                  Hsin{-}Jung Huang and
                  Jeng{-}Bin Chen and
                  Chih{-}Pin Su and
                  Cheng{-}Wen Wu and
                  Chuang Cheng and
                  Shao{-}I Chen and
                  Chi{-}Yi Hwang and
                  Hsiao{-}Ping Lin},
  title        = {A Hierarchical Test Scheme for System-On-Chip Designs},
  booktitle    = {2002 Design, Automation and Test in Europe Conference and Exposition
                  {(DATE} 2002), 4-8 March 2002, Paris, France},
  pages        = {486--490},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/DATE.2002.998317},
  doi          = {10.1109/DATE.2002.998317},
  timestamp    = {Tue, 17 Oct 2023 15:22:33 +0200},
  biburl       = {https://dblp.org/rec/conf/date/LiHCSWCCHL02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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