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BibTeX record conf/date/KraftSMWW018
@inproceedings{DBLP:conf/date/KraftSMWW018, author = {Kira Kraft and Chirag Sudarshan and Deepak M. Mathew and Christian Weis and Norbert Wehn and Matthias Jung}, editor = {Jan Madsen and Ayse K. Coskun}, title = {Improving the error behavior of {DRAM} by exploiting its Z-channel property}, booktitle = {2018 Design, Automation {\&} Test in Europe Conference {\&} Exhibition, {DATE} 2018, Dresden, Germany, March 19-23, 2018}, pages = {1492--1495}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.23919/DATE.2018.8342249}, doi = {10.23919/DATE.2018.8342249}, timestamp = {Sun, 25 Jul 2021 11:54:09 +0200}, biburl = {https://dblp.org/rec/conf/date/KraftSMWW018.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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