BibTeX record conf/date/KraftSMWW018

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@inproceedings{DBLP:conf/date/KraftSMWW018,
  author       = {Kira Kraft and
                  Chirag Sudarshan and
                  Deepak M. Mathew and
                  Christian Weis and
                  Norbert Wehn and
                  Matthias Jung},
  editor       = {Jan Madsen and
                  Ayse K. Coskun},
  title        = {Improving the error behavior of {DRAM} by exploiting its Z-channel
                  property},
  booktitle    = {2018 Design, Automation {\&} Test in Europe Conference {\&}
                  Exhibition, {DATE} 2018, Dresden, Germany, March 19-23, 2018},
  pages        = {1492--1495},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.23919/DATE.2018.8342249},
  doi          = {10.23919/DATE.2018.8342249},
  timestamp    = {Sun, 25 Jul 2021 11:54:09 +0200},
  biburl       = {https://dblp.org/rec/conf/date/KraftSMWW018.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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