Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing.

S. Saqib Khursheed Bashir M. Al-Hashimi Peter Harrod Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing. 1349-1354 2009 DATE http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5090609&arnumber=5090874&count=326&index=260 conf/date/2009 db/conf/date/date2009.html#KhursheedAH09