BibTeX record conf/date/KhursheedAH09

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@inproceedings{DBLP:conf/date/KhursheedAH09,
  author       = {S. Saqib Khursheed and
                  Bashir M. Al{-}Hashimi and
                  Peter Harrod},
  editor       = {Luca Benini and
                  Giovanni De Micheli and
                  Bashir M. Al{-}Hashimi and
                  Wolfgang M{\"{u}}ller},
  title        = {Test cost reduction for multiple-voltage designs with bridge defects
                  through Gate-Sizing},
  booktitle    = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France,
                  April 20-24, 2009},
  pages        = {1349--1354},
  publisher    = {{IEEE}},
  year         = {2009},
  url          = {https://doi.org/10.1109/DATE.2009.5090874},
  doi          = {10.1109/DATE.2009.5090874},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/date/KhursheedAH09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}